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Number of items: 1. Harutyunyan, A.G. and Kajoyan, A.H. (2008) INCREASE IN THERMAL RELIABILITY OF INTEGRATED CIRCUITS AT THE STAGE OF PLACEMENT OF CELLS. In: THE SIXTH INTERNATIONAL CONFERENCE “SEMICONDUCTOR MICRO – AND NANOELECTRONICS”, SEPTEMBER 18-20, 2007, TSAKHKADZOR, Armenia. |