Armenian Journal of Physics

Laser Profilometer with Micron Spatial Resolution

Vardanyan, A.O. and Melikyan, S.R. and Movsesyan, K.A. and Oganesyan, D.L. and Chakhoyan, E.V. (2017) Laser Profilometer with Micron Spatial Resolution. Armenian Journal of Physics, 10 (3). pp. 99-103. ISSN 1829-1171

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A new method of remote measurement of the roughness of a surface based on a non-linear optical profilometer is suggested and investigated. It is shown that for the spectral resolution of the spectrograph of 0.2 μm the linear resolution is 18 microns.

Item Type:Article
Subjects:Physics > 07.Instruments, apparatus, components common to several branches of physics
Physics > 42.Optics
Physics > 73.Electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures
ID Code:901
Deposited By:Prof. Vladimir Aroutiounian
Deposited On:06 Oct 2017 00:27
Last Modified:06 Oct 2017 00:27

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