Armenian Journal of Physics

X-Ray Elastic Constants of ZnO Thin Films

Ayoqi, Najmeh and Zolanvari, Abdolali (2014) X-Ray Elastic Constants of ZnO Thin Films. Armenian Journal of Physics, 7 (2). pp. 87-92. ISSN 1829-1171

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Abstract

Elastic constants of zinc oxide thin films have been determined using sin2? method. Surface morphology and crystalline structure of zinc oxide were examined, using atomic force microscope (AFM) and field emission scanning electron microscope (FESEM). The different planes and lattice parameters of ZnO films were obtained by High Temperature X-Ray Diffraction (HT-XRD) method. The minimum stress and residual stress were found to be 1.27±4.88 Mpa and4.62±0.23 Mpa for (101) and (110) different atomic planes.

Item Type:Article
Subjects:Physics > 73.Electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures
ID Code:677
Deposited By:Prof. Vladimir Aroutiounian
Deposited On:27 May 2014 08:28
Last Modified:27 May 2014 13:54

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