Armenian Journal of Physics

Characterization and Optical Absorption Properties of Plasmonic Nanostructured Thin Films

Ranjgar, A. and Norouzi, R. and Zolanvari, A. and Sadeghi, H. (2013) Characterization and Optical Absorption Properties of Plasmonic Nanostructured Thin Films. Armenian Journal of Physics, 6 (4). pp. 198-203. ISSN 1829-1171

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Abstract

Ag (Au)/SiO2 nanostructured thin films were fabricated on n-type silicon substrates by Radio Frequency (RF) magnetron sputtering technique. Crystalline, surface topography and optical properties of the prepared films were analyzed using X-ray diffractometry (XRD) technique, Atomic Force Microscopy (AFM) and UV–visible spectrophotometry, respectively. Optical absorption spectrum of the Ag/SiO2 thin films showed one surface plasmon resonance (SPR) absorption peak located at 310 nm relating to silver nanoparticles while the SPR peak in Au/SiO2 sample experienced a redshift around 450 nm.

Item Type:Article
Subjects:Physics > 42.Optics
Physics > 73.Electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures
Physics > 81.Materials science
Physics > 85.Electronic and magnetic devices; microelectronics
ID Code:647
Deposited By:Prof. Vladimir Aroutiounian
Deposited On:15 Dec 2013 12:27
Last Modified:15 Dec 2013 12:27

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