Armenian Journal of Physics

EFFECTIVE ANISOTROPY OF FE/SI THIN FILMS AND ITS NANOSTRUCTURE

Zolanvari, A. and Sadeghi, H. and Nezamdost, J. (2009) EFFECTIVE ANISOTROPY OF FE/SI THIN FILMS AND ITS NANOSTRUCTURE. Armenian Journal of Physics, 2 (4). pp. 295-301. ISSN 1829-1171

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Abstract

The 5 to 150 nm thicknesses of Fe layers have been deposited by evaporation method onto Si substrates. Magnetic properties of samples are measured by using Magnetic Force Microscopy (MFM) and Alternating Gradient Force Magnetometry (AGFM). Structural and magnetic properties of samples have been reported from domains structure in MFM images as well as hysteresis loops in AGFM results. The domains width in Fe samples with 100 nm thickness were estimated about 2–4 μm. The XRD patterns are also show the formation of β-FeSi2 phase after annealing up to 700°C. The calculated effective anisotropy for samples with different thicknesses also shows oscillations with increasing Fe layer thickness.

Item Type:Article
Subjects:Physics > 81.Materials science
ID Code:198
Deposited By:Prof. Vladimir Aroutiounian
Deposited On:22 Dec 2009 15:23
Last Modified:19 Sep 2013 05:05

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