Armenian Journal of Physics

X-Ray Diffraction Method for Investigation of Imperfections in Crystals Based on Interpretation of Sectional Topogram

Drmeyan, H.R. and Margaryan, H.G. (2020) X-Ray Diffraction Method for Investigation of Imperfections in Crystals Based on Interpretation of Sectional Topogram. Armenian Journal of Physics, 13 (3). pp. 255-262. ISSN 1829-1171

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Abstract

To increase the resolution of X-ray diffraction methods, a new method is proposed in the work, which is theoretically proven and with which thin structures of diffraction images are experimentally observed. The X-ray interference pattern obtained by X-ray diffraction in a system consisting of a two-crystal system with a narrow gap and a thick absorbing crystal was studied. The theoretical period of the interbranch scattered bands obtained from this system is calculated. It is shown that the presence of a thick plate makes it possible to increase the period of the bands by about 5 to 10 times. For the first time, two dynamic effects were simultaneously observed: on one topogram, interbranch scattering bands and moire patterns formed in a two-crystal system were observed.

Item Type:Article
Subjects:Physics > 42.Optics
ID Code:1117
Deposited By:Prof. Vladimir Aroutiounian
Deposited On:31 Jul 2020 00:09
Last Modified:31 Jul 2020 00:09

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